B1500A半導(dǎo)體B1506AB1505A

B1500A半導(dǎo)體AgilentB1500A半導(dǎo)體測試儀B1500A曾佳=======================================
深圳佳捷倫電子儀器有限公司曾佳
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地址：深圳市龍崗區(qū)平新北路163號廣弘星座B棟12樓
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B1500A Semiconductor Device Analyzer
Key Features & Specifications
General features
PC-based instrument with Microsoft ? Windows ? OS and EasyEXPERT software
Single-box solution for current-voltage (IV), capacitance-voltage (CV), pulse generation, fast IV, and time-domain measurement.
Ten module slots for source monitor units (SMUs) and other module types (MFCMU, HV-SPGU and WGFMU)
Offline data analysis and application test development via Desktop EasyEXPERT software
Measurement capabilities
Supports current-voltage (IV) measurement to 0.1fA and 0.5μV
Supports both quasi-static and medium-frequency capacitance-voltage (CV) measurement
Supports accurate fast IV and time-domain measurement for a wide range of applications such as pulsed IV, NBTI and RTS noise (RTN) measurement.
Supports high voltage pulse generation (up to ±40 V) for high power and memory device testing.
Description
Summary
The Agilent B1500A Semiconductor Device Analyzer is a modular instrument with a ten-slot configuration that supports both IV and CV measurements and also fast high-voltage pulsing. Its familiar, Microsoft ? Windows ? user interface supports Agilent’s EasyEXPERT software, which provides a new, more intuitive task-oriented approach to device characterization. Because of its extremely low-current, low-voltage, and integrated capacitance measurement capabilities, the Agilent B1500A can be used for a wide range of semiconductor device characterization needs (IC-CAP supports the B1500A). It is also an excellent solution for non-volatile memory cell characterization and high-speed device characterization (including advanced NBTI and RTS noise (RTN) measurement).

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